SoC based pattern recognition for Non Destructive Testing systems
International Workshop on Machine Learning, Optimization and Big Data - july 2015
Références BibTex
@Article{SANS15,
author = {Schiaratura, O. and Ansaloni, P. and Neri, M. and Simonetto, A.},
title = {SoC based pattern recognition for Non Destructive Testing systems},
journal = {International Workshop on Machine Learning, Optimization and Big Data},
month = {july},
year = {2015},
publisher = {Springer},
keywords = {Non-destructive testing SoC ARM CUDA OpenCL},
url = {https://publications.crs4.it/pubdocs/2015/SANS15},
}