CRS4

A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps

Matteo Meneghini, M Bertin, G dal Santo, A Stocco, A Chini, Giovanna Mura, Elodia Musu, Massimo Vanzi, Gaudenzio Meneghesso
proceedings IEDM 2012, The IEEE International Electron Devices Meeting. - 2012

BibTex references

@InProceedings{MBDSCMMMMVMZ12,
  author       = {Meneghini, M. and Bertin, M. and dal Santo, G. and Stocco, A. and Chini, A. and Mura, G. and Musu, E. and Vanzi, M. and Meneghesso, G.},
  title        = {A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures  related to the generation of interface traps},
  booktitle    = {proceedings IEDM 2012, The IEEE International  Electron Devices Meeting.},
  series       = {The IEEE International  Electron Devices Meeting.},
  year         = {2012},
  keywords     = {Al GAn degradetion mechanism, Failure analysis},
  url          = {https://publications.crs4.it/pubdocs/2012/MBDSCMMMMVMZ12},
}

Other publications in the database

» Giovanna Mura
» Elodia Musu
» Massimo Vanzi