Modifier la recherche | Format imprimable | Votre sélection |
Peer-reviewed publications in International Journals |
[2-VPM13] |
Microelectronics Reliability Elsevier pages 1399-1402 vol. 53 num. 9-11 - september 2013 issn: 0026-2714 |
Books and Book Chapters |
[1-PGT12]
|
Atti della XLIV Riunione Scientifica dell'Istituto Italiano di Preistoria e Protostoria, Cagliari-Barumini-Sassari, I.I.P.P. - 2012 |
Peer-reviewed publications in international events |
[4-MBD12] |
proceedings IEDM 2012, The IEEE International Electron Devices Meeting. The IEEE International Electron Devices Meeting. - 2012 |
Various talks, works and publications |
[4-PVM12] |
EFUG2012 - 2012 |
Peer-reviewed publications in international events |
[4-VP11] |
10th Multinational Congress on Microscopy 2011 Società Italiana Scienze Microscopiche pages 715-716 Elisabetta Falcieri SISM - 2011 |
[4-VP11] |
10th Multinational Congress on Microscopy 2011 Società Italiana Scienze Microscopiche pages 71-72 Elisabetta Falcieri SISM - 2011 |
Peer-reviewed publications in international events |
[4-PPV10] |
Microscience 2010 Royal Microscopy society RMS - 2010 |
Peer-reviewed publications in International Journals |
[2-MPP08]
|
Microscopy and Microanalysis pages 892--893 vol. 14 num. Suppl. 2 - 2008 |
[2-PPV08]
|
Microscopy and Microanalysis pages 608--609 vol. 14 num. Suppl. 2 - 2008 |
Peer-reviewed publications in international events |
[4-PPV08]
|
EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany Springer pages 597--598 - 2008 |
Contractual reports |
[7-MVP05] |
Department of Electric and Electronic Engineering DIEE, University of Cagliari - CRS4 Cagliari, Italy num. 05/15 techreport - march 2005 |